Cover IEC TS 61945:2000

IEC TS 61945:2000

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

Ausgabedatum: 2000-03
Edition: 1.0
Sprache: EN-FR - zweisprachig englisch/französisch
Seitenzahl: 23 VDE-Artnr.: 209305


Gives the methodology for technology and failure analysis in manufacturing integrated circuits. Technology analysis is used to determine the way a component is built by observing it using adequate resolution, which increases progressively with the level of analysis.