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IEC TS 62804-1:2015

Photovoltaic (PV) modules - Test methods for the detection of potential-induced degradation - Part 1: Crystalline silicon

Ausgabedatum: 2015-08
Edition: 1.0
Sprache: EN - englisch
Seitenzahl: 15 VDE-Artnr.: 222003

Inhaltsverzeichnis

IEC TS 62804-1:2015(E) defines procedures to test and evaluate the durability of crystalline silicon photovoltaic (PV) modules to the effects of short-term high-voltage stress including potential-induced degradation (PID). Two test methods are defined that do not inherently produce equivalent results. They are given as screening tests; neither test includes all the factors existing in the natural environment that can affect the PID rate. The methods describe how to achieve a constant stress level. The testing in this Technical Specification is designed for crystalline silicon PV modules with one or two glass surfaces, silicon cells having passivating dielectric layers, for degradation mechanisms involving mobile ions influencing the electric field over the silicon semiconductor, or electronically interacting with the silicon semiconductor itself.

Buchtitel Format
Photovoltaikanlagen
Bergmann, Arno

Photovoltaikanlagen

Normgerecht errichten, betreiben, herstellen und konstruieren Erläuterungen zu den Normen der Reihe VDE 0126, DIN EN 50380, DIN EN 50438 (VDE 0435-901), DIN CLC/TS 50539-12 (VDE V 0675-39-12), DIN EN 60904-8, DIN EN 61194, DIN EN 61345, DIN EN 61427, DIN EN 61683, DIN EN 61829, DIN EN 62124 und unter Berücksichtigung der VDE-Anwendungsregel VDE AR-N 4105
VDE-Schriftenreihe – Normen verständlich, Band 138

2011, 115 Seiten, Din A5, Broschur

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