Cover IEC 61788-7:2020 RLV

IEC 61788-7:2020 RLV

Superconductivity - Part 7: Electronic characteristic measurements - Surface resistance of high-temperature superconductors at microwave frequencies

Ausgabedatum: 2020-03
Edition: 3.0
Sprache: EN - englisch
Seitenzahl: 132 VDE-Artnr.: 248519


IEC 61788-7:2020 RLV contains both the official IEC International Standard and its Redline version. The Redline version is available in English only and provides you with a quick and easy way to compare all the changes between the official IEC Standard and its previous edition.

IEC 61788-7:2020 describes measurement of the surface resistance (Rs) of superconductors at microwave frequencies by the standard two-resonator method. The object of measurement is the temperature dependence of Rs at the resonant frequency. The applicable measurement range of Rs for this method is as follows:
- Frequency: 8 GHz < f < 30 GHz
- Measurement resolution: 0,01 m ? at 10 GHz
The Rs data at the measured frequency, and that scaled to 10 GHz, assuming the f 2 rule for comparison, is reported. This third edition cancels and replaces the second edition, published in 2006. This edition constitutes a technical revision. This edition includes the following significant technical changes with respect to the previous edition:
a) informative Annex B, relative combined standard uncertainty for surface resistance measurement has been added;
b) precision and accuracy statements have been converted to uncertainty;
c) reproducibility in surface resistant measurement has been added.