Cover IEC TS 63202-2:2021

IEC TS 63202-2:2021

Photovoltaic cells - Part 2: Electroluminescence imaging of crystalline silicon solar cells

Ausgabedatum: 2021-12
Edition: 1.0
Sprache: EN - englisch
Seitenzahl: 19 VDE-Artnr.: 250592


IEC TS 63202-2:2021 specifies methods to detect and examine defects on bare crystalline silicon (c-Si) solar cells by means of electroluminescence (EL) imaging with the cell being placed in forward bias. It firstly provides guidelines for methods to capture electroluminescence images of non-encapsulated c-Si solar cells. In addition, it provides a list of defects which can be detected by EL imaging and provides information on the different possible methods to detect and differentiate such defects.