IEC TS 62876-4-1:2025
Nanomanufacturing – Reliability assessment – Part 4-1: Nanophotonic products – Optical stability test of quantum dot enabled light conversion films: Temperature, humidity and light exposure
                                
                                    Ausgabedatum:
                                    2025-02
                                    Edition:
                                        1.0
                                        
                                    Sprache: EN - englisch
                                    Seitenzahl: 24                                    VDE-Artnr.: 254854
                                
                            
                                                                            IEC TS 62876-4-1:2025, which is a Technical Specification, establishes a general reliability testing programme to verify the reliability of the performance of quantum dots nanomaterials, and quantum dot enabled light conversion films (Q-LCFs).
The Q-LCF is used as subassemblies for the fabrication of nano-enabled photoelectrical display devices, mainly liquid crystal display (LCD) currently, with other components.
This testing programme defines standardized aging conditions, methodologies and data assessment for Q-LCF product.
The results of these tests define a stability under standardized aging conditions for quantitative evaluation of the reliability of the Q-LCF.
The procedures specified in this document were designed for Q-LCF but can be extended to serve as a guideline for other kinds of light conversion films or related subassemblies as well.                                                                    

