IEC 60747-15:2024 RLVSemiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
544,00 €
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IEC 60747-15:2024Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
320,00 €
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IEC 60747-16-9:2024Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
249,99 €
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IEC 62047-47:2024Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures
80,00 €
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IEC 62047-48:2024Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device
80,00 €
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IEC 62047-43:2024Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
115,00 €
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IEC 62047-44:2024Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
115,00 €
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IEC 60747-5-16:2023Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
115,00 €
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IEC 60747-18-4:2023Semiconductor devices - Part 18-4: Semiconductor bio sensors - Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
80,00 €
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IEC 60747-18-5:2023Semiconductor devices - Part 18-5: Semiconductor bio sensors - Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light
80,00 €
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IEC 62951-8:2023Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
80,00 €
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IEC 62951-9:2022Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
115,00 €
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IEC 63364-1:2022Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
80,00 €
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IEC 60747-16-7:2022Semiconductor devices - Part 16-7: Microwave integrated circuits - Attenuators
280,00 €
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IEC 60747-16-8:2022Semiconductor devices - Part 16-8: Microwave integrated circuits - Limiters
249,99 €
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IEC TR 63357:2022Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
80,00 €
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IEC 62047-42:2022Semiconductor devices - Micro-electromechanical devices - Part 42: Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
155,00 €
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IEC 63068-4:2022Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
155,00 €
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IEC 60747-5-14:2022Semiconductor devices - Part 5-14: Optoelectronic devices - Light emitting diodes - Test method of the surface temperature based on the thermoreflectance method
155,00 €
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IEC 63373:2022Dynamic on-resistance test method guidelines for GaN HEMT based power conversion devices
80,00 €
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