IEC 60747-5-13:2021/AMD1:2026Amendment 1 - Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
10,70 €
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IEC 60747-5-13:2021+AMD1:2026 CSV (Consolidated Version)Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages
230,05 €
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IEC 62047-4:2026 RLVSemiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
209,72 €
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IEC 62047-4:2026Semiconductor devices - Micro-electromechanical devices - Part 4: Generic specification for MEMS
123,05 €
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IEC 62047-49:2025Semiconductor devices - Micro-electromechanical devices - Part 49: Temperature and humidity test methods for piezoelectric MEMS cantilevers
21,40 €
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IEC 63150-2:2025Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 2: Human arm swing motion
171,20 €
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IEC 63150-3:2025Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 3: Human foot impact motion
171,20 €
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IEC 62047-53:2025Semiconductor devices - Micro-electromechanical devices - Part 53: MEMS electrothermal transfer device
85,60 €
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IEC TR 63571:2025Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
171,20 €
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IEC 62047-50:2025Semiconductor devices - Micro-electromechanical devices - Part 50: MEMS capacitive microphones
85,60 €
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IEC 62047-46:2025Semiconductor devices - Micro-electromechanical devices - Part 46: Silicon based MEMS fabrication technology - Measurement method of tensile strength of nanoscale thickness membrane
85,60 €
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IEC 62047-45:2025Semiconductor devices - Micro-electromechanical devices - Part 45: Silicon based MEMS fabrication technology - Measurement method of impact resistance of nanostructures
85,60 €
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IEC 60747-15:2024 RLVSemiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
609,90 €
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IEC 60747-15:2024Semiconductor devices - Part 15: Discrete devices - Isolated power semiconductor devices
358,45 €
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IEC 60747-16-9:2024Semiconductor devices - Part 16-9: Microwave integrated circuits - Phase shifters
278,20 €
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IEC 62047-47:2024Semiconductor devices - Micro-electromechanical devices - Part 47: Silicon based MEMS fabrication technology - Measurement method of bending strength of microstructures
85,60 €
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IEC 62047-48:2024Semiconductor devices - Micro-electromechanical devices - Part 48: Test method for determining solution concentration by optical absorption using MEMS fluidic device
85,60 €
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IEC 62047-43:2024Semiconductor devices - Micro-electromechanical devices - Part 43: Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
123,05 €
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IEC 62047-44:2024Semiconductor devices - Micro-electromechanical devices - Part 44: Test methods for dynamic performances of MEMS resonant electric-field-sensitive devices
123,05 €
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IEC 60747-5-16:2023Semiconductor devices - Part 5-16: Optoelectronic devices - Light emitting diodes - Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
123,05 €
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