IEC 60368-4-1:2000

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

IEC 60368-4:2000

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

IEC 60368-1:2000

Piezoelectric filters of assessed quality - Part 1: Generic specification

IEC 60444-1:1986/AMD1:1999

Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

IEC 60679-5-1:1998

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

IEC 60679-5:1998

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

IEC 60679-4-1:1998

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

IEC 60679-4:1997

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

IEC 60368-2-2:1996

Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters

IEC 60444-5:1995

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

IEC 61261-1:1994

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

IEC 61261-2:1994

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

IEC 61261-2-1:1994

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

IEC 60642-2:1994

Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units

IEC 61253-2-1:1993

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

IEC 61253-2:1993

Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

IEC 61253-1:1993

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

IEC 60122-2-1:1991/AMD1:1993

Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

IEC 61178-3:1993

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

IEC 61178-2:1993

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval