IEC 62228-2:2016Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers
280,00 €
|
IEC 62433-4:2016EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)
385,00 €
|
IEC 62132-1:2015Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
155,00 €
|
IEC TR 61967-1-1:2015Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
365,00 €
|
IEC TS 61967-3:2014Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
249,99 €
|
IEC TS 62132-9:2014Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method
200,00 €
|
IEC 62215-3:2013Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method
249,99 €
|
IEC 62132-8:2012Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method
155,00 €
|
IEC TR 62433-2-1:2010EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission
200,00 €
|
IEC 61967-6:2002/COR1:2010Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
0,00 €
|
IEC 62132-2:2010Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method
155,00 €
|
IEC 61967-6:2002+AMD1:2008 CSV (Consolidated Version)Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
545,00 €
|
IEC 61967-6:2002/AMD1:2008Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
115,00 €
|
IEC 60748-2-20:2008Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits
155,00 €
|
|
|
IEC TS 62215-2:2007Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method
200,00 €
|
IEC TS 62404:2007Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)
365,00 €
|
IEC 60748-4-3:2006Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)
249,99 €
|
IEC 62132-4:2006Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
155,00 €
|
IEC TR 61967-4-1:2005Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 O/150 O direct coupling method - Application guidance to IEC 61967-4
280,00 €
|
Seite 2 von 5
© VDE VERLAG GmbH, Berlin - Offenbach