IEC 60749-7:2025Semiconductor devices - Mechanical and climatic test methods - Part 7: Internal moisture content measurement and the analysis of other residual gases
80,00 €
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IEC 60749-24:2025 RLVSemiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
68,00 €
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IEC 60749-24:2025Semiconductor devices - Mechanical and climatic test methods - Part 24: Accelerated moisture resistance - Unbiased HAST
40,00 €
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IEC 60749-22-1:2025Semiconductor devices - Mechanical and climatic test methods - Part 22-1: Bond strength - Wire bond pull test methods
365,00 €
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IEC 60749-22-2:2025Semiconductor devices - Mechanical and climatic test methods - Part 22-2: Bond strength - Wire bond shear test methods
249,99 €
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IEC 63150-2:2025Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 2: Human arm swing motion
155,00 €
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IEC 63150-3:2025Semiconductor devices - Measurement and evaluation methods of kinetic energy harvesting devices under practical vibration environment - Part 3: Human foot impact motion
155,00 €
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IEC 60749-34-1:2025Semiconductor devices - Mechanical and climatic test methods - Part 34-1: Power cycling test for power semiconductor module
200,00 €
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IEC TR 63571:2025Semiconductor devices – Estimation method for lifetime conversion from “PART” to “SYSTEM”
155,00 €
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IEC 60749-5:2023Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
40,00 €
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IEC 60749-5:2023 RLVSemiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test
68,00 €
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IEC 63287-2:2023Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile
80,00 €
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IEC 62951-8:2023Semiconductor devices - Flexible and stretchable semiconductor devices - Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory
80,00 €
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IEC 62951-9:2022Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
115,00 €
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IEC 63364-1:2022Semiconductor devices - Semiconductor devices for IoT system - Part 1: Test method of sound variation detection
80,00 €
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IEC 60749-37:2022Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
155,00 €
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IEC 60749-37:2022 RLVSemiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
264,00 €
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IEC TR 63357:2022Semiconductor devices - Standardization roadmap of fault test method for automotive vehicles
80,00 €
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IEC 63068-4:2022Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 4: Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
155,00 €
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