IEC TS 61994-4-4:2018 RLVPiezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
104,00 €
|
IEC 61837-2:2018Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
375,00 €
|
IEC 62884-3:2018Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
80,00 €
|
|
IEC 60122-1:2002/AMD1:2017Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
40,00 €
|
IEC 60122-1:2002+AMD1:2017 CSV (Consolidated Version)Quartz crystal units of assessed quality - Part 1: Generic specification
335,00 €
|
IEC 62884-2:2017Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
150,00 €
|
IEC 60679-1:2017Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
235,00 €
|
IEC 62884-1:2017Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
345,00 €
|
IEC 60444-8:2016Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
80,00 €
|
IEC 61240:2016Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
115,00 €
|
IEC 62276:2016Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
235,00 €
|
|
IEC 62575-1:2015Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
235,00 €
|
IEC 60862-1:2015Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
270,00 €
|
IEC 61338-1-5:2015Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
115,00 €
|
IEC 61837-3:2015Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
115,00 €
|
IEC 61837-4:2015Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
80,00 €
|
IEC 62761:2014Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
150,00 €
|
IEC 60368-1:2000+AMD1:2004 CSV (Consolidated Version)Piezoelectric filters of assessed quality - Part 1: Genericspecification
335,00 €
|