IEC 61967-8:2023Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
115,00 €
|
IEC 61967-8:2023 RLVIntegrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method
150,00 €
|
IEC 61967-4:2021Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
270,00 €
|
IEC 61967-4:2021 RLVIntegrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
351,00 €
|
IEC 61967-1:2018Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
190,00 €
|
IEC 61967-1:2018 RLVIntegrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions
247,00 €
|
IEC TR 61967-1-1:2015Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format
345,00 €
|
IEC TS 61967-3:2014Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method
235,00 €
|
IEC 61967-6:2002/COR1:2010Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
0,00 €
|
IEC 61967-6:2002+AMD1:2008 CSV (Consolidated Version)Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
385,00 €
|
IEC 61967-6:2002/AMD1:2008Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
115,00 €
|
IEC 61967-2:2005Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method
150,00 €
|
IEC TR 61967-4-1:2005Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 O/150 O direct coupling method - Application guidance to IEC 61967-4
270,00 €
|
IEC 61967-6:2002Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method
190,00 €
|
© VDE VERLAG GmbH, Berlin - Offenbach