RF Built-In Self-Test for Integrated Cellular Transmitters

Konferenz: ANALOG '06 - 9. ITG/GMM-Fachtagung
27.09.2006 - 29.09.2006 in Dresden, Germany

Tagungsband: ANALOG '06

Seiten: 5Sprache: EnglischTyp: PDF

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Münker, Christian (Infineon Technologies AG, P.O. Box 80 09 49, 81609 München, Germany)
Weigel, Robert (Chair of Electronics, University of Erlangen-Nuremberg, Germany)

A spectral built-in self test (BIST) solution for integrated cellular RF transmitters is presented that enables on-chip verification of PLL spectral performance. Multi-tone FM test signals with a spurious-free dynamic range (SFDR) of 60 dB are generated without compromising the performance of the RF transmitter itself. The RF signal is demodulated and digitized in an on-chip digital FM discriminator, spectral analysis is performed using digital narrowband filtering. The additional BIST blocks are fully digital and have been implemented on a chip area of only 0.05 mm2 in a 130 nm CMOS technology. The test blocks allow fast measurement of PLL frequency response, level of spurious sidebands and in-band phase noise down to -80 dBc without external test equipment. Catastrophic faults and most parametric faults can be detected as long as they influence the loop bandwidth or deteriorate spectral performance.