Material Characterization of Liquid Crystals at THz-Frequencies using a Free Space Measurement Setup

Konferenz: GeMIC 2008 - German Microwave Conference
10.03.2008 - 12.03.2008 in Hamburg-Harburg, Germany

Tagungsband: GeMIC 2008

Seiten: 4Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Koeberle, M.; Mueller, S.; Jakoby, R. (Technische Universität Darmstadt, Wireless Communications Lab, Merckstr. 25, 64283 Darmstadt, Germany)
Göbel, T.; Meissner, P. (Technische Universität Darmstadt, Optical Communications Lab, Merckstr. 25, 64283 Darmstadt, Germany)
Schönherr, D.; Hartnagel, H.-L. (Technische Universität Darmstadt, Microwave Electronics Lab, Merckstr. 25, 64283 Darmstadt, Germany)

Liquid crystals (LCs) are promising materials for passive tunable components at microwave frequencies and optics. With increasing interest in the THz frequency domain the quest on tunable THz components rises. For the systematic design of such tunable components like phase shifters or reflect arrays a detailed knowledge of the dielectric material properties at the intended frequency is needed. In this paper we show measurement results for the characterization of two commercial LCs (K15 and E7, both from Merck) at frequencies between 100 and 350 GHz performed with a free space CW THz system. An anisotropy of DeltanK15 = 0, 05 and DeltanE7 = 0, 08, respectively, could be determined in this frequency range.