Determination of complex permittivity using a scalar quasi-optical measurement system in the E-band
Konferenz: GeMIC 2008 - German Microwave Conference
10.03.2008 - 12.03.2008 in Hamburg-Harburg, Germany
Tagungsband: GeMIC 2008
Seiten: 3Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Pfeiffer, Florian; Biebl, Erwin M. (Technische Universität München, Fachgebiet Höchstfrequenztechnik, Arcisstr. 21, 80333 Munich, Germany)
We developed a low-cost quasi-optical measurement system to determine the complex permittivity in the E-band (from 60 to 90 GHz). The evaluation is done in a non-destructive way and can be used for all kinds of single-layered and multi-layered dielectric materials. The method is based on measurements of the scalar transmission coefficient through planar samples for several angles of incidence and two different polarization states. A numerical optimization technique is used to derive the complex permittivity from the measured coefficients. The method utilizes a physical model of a dielectric slab of known thickness, which assumes that a plane wave is incident on the surface of the dielectric material. Measurement results are presented, which are in good agreement with data from a similar system using vector measurement.