Automated Measurements of Complex Scattering Parameters

Konferenz: GeMIC 2008 - German Microwave Conference
10.03.2008 - 12.03.2008 in Hamburg-Harburg, Germany

Tagungsband: GeMIC 2008

Seiten: 4Sprache: EnglischTyp: PDF

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Rolfes, Ilona (Universität Hannover, Institut für Hochfrequenztechnik und Funksysteme, Appelstr. 9A, 30167 Hannover, Germany)
Will, Bianca (Ruhr-Universität Bochum, Institut für Hochfrequenztechnik, Universitätsstr. 150, 44801 Bochum, Germany)

In this article, the automation of calibrated vector network analyzer measurements is presented. Aiming at a userfriendly and optimized measurement setup for the determination of the complex scattering parameters of one-, two- or even multi-port devices, a measurement method is described which reduces the number of required connector contacts by the user. An integration of the proposed setup into a network analyzer system is possible. Thus, a measurement system being fast and automatically calibrated at its measurement ports becomes realizable. The calibration is repeatable without having to remove the device under test (DUT) from the measurement ports. For the elimination of the influence of additional cables which might be needed for the connection of the DUT, a complimentary measurement of the used cables in transmission as well as in reflection with a reflection standard placed at the phase reference plane is sufficient.