A Network Analyzer System for Pulse Profile Measurements

Konferenz: GeMIC 2008 - German Microwave Conference
10.03.2008 - 12.03.2008 in Hamburg-Harburg, Germany

Tagungsband: GeMIC 2008

Seiten: 3Sprache: EnglischTyp: PDF

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Bednorz, Thilo (Rohde&Schwarz, 1 ESP, Muehldorfstrasse 15, 81671 Munich, Germany)

A novel approach is presented for a measurement system that is able to investigate the behavior of microwave circuits and components under pulsed conditions. This technique is integrated into a vector network analyzer to measure not only power levels but also scattering parameters of short pulses. In comparison to other systems, it does not need periodical pulses and does not require complicated and expensive hardware to chop the signals for subsequent pulse reconstruction.