Model-based Testing and Diagnosis for Mixed-signal Systems-in-Package
Konferenz: Zuverlässigkeit und Entwurf - 2. GMM/GI/ITG-Fachtagung
29.09.2008 - 01.10.2008 in Ingolstadt, Germany
Tagungsband: Zuverlässigkeit und Entwurf
Seiten: 8Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Müller, Reik; Jentschel, Hans-Joachim (Dresden University of Technology, Dresden, Germany)
Wegener, Carsten; Sattler, Sebastian (Infineon Technologies AG, Munich, Germany)
Linear and non-linear Model-based Testing (MbT) has been developed in the past for mixed-signal devices. While linear MbT has even been adopted in production test for Digital-to-Analog Converters (DACs) with a static nonlinear transfer characteristic, linear MbT applied to cascades of static nonlinearities and dynamic linear systems does not yield sufficiently precise test and diagnosis capabilities. In this paper, we present a general introduction to MbT that includes diagnosis of cascaded systems. We focus on linear MbT, which reduces the computational effort of MbT to multiplying matrices during production tests. The computational effort is greater for non-linear models. We use the specific example of a DAC followed by a low-pass filter that is located, for example, at the boundary between the digital baseband and the RF front-end of a typical transceiver. One technology for integrating the digital baseband and the RF front-end is System-in- Package (SiP), which limits the access to internal signals. In addition, a reference procedure for MbT is reported which makes it possible to evaluate and to compare various linear and non-linear MbT approaches with respect to specific test applications.