Robust Analog Design for Automotive Applications by Design Centering

Konferenz: Zuverlässigkeit und Entwurf - 2. GMM/GI/ITG-Fachtagung
29.09.2008 - 01.10.2008 in Ingolstadt, Germany

Tagungsband: Zuverlässigkeit und Entwurf

Seiten: 8Sprache: EnglischTyp: PDF

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Sobe, Udo; Rooch, Karl-Heinz (ZMD Zentrum Mikroelektronik Dresden AG, Grenzstraße 28, 01109 Dresden)
Pronath, Michael (MunEDA GmbH, Stefan-George-Ring, 81929 München)

The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or voltage stress, causes a shift of device parameters, for example threshold voltage Vth, which can also be modeled as a degradation of transistor parameters. Therefore, in order to design circuits, which are robust and reliable, analysis and optimization of their sensitivity to variations in model parameters is important. Furthermore, constraints on the operating regions and voltage differences of transistors are used in order to keep operating points stable over a large temperature range. In this work, using three circuits for automotive applications and current process development kits (PDK), we show how design centering software can be used to consider both sensitivity reduction towards model parameter variation and constraints to control safe operating areas (SOA).