Comparing Two AnalogWaveforms - A Trivial Task?

Konferenz: Zuverlässigkeit und Entwurf - 2. GMM/GI/ITG-Fachtagung
29.09.2008 - 01.10.2008 in Ingolstadt, Germany

Tagungsband: Zuverlässigkeit und Entwurf

Seiten: 2Sprache: EnglischTyp: PDF

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Ohlendorf, Ole (Institute of Microelectronic Systems, University of Hannover, Germany)
Steinhorst, Sebastian; Hedrich, Lars (Institute of Computer Science, University of Frankfurt/Main, Germany)
Hartong, Walter (Cadence Design Systems, Feldkirchen, Germany)

of an evolving design to compare the next version of the design against the previous or to compare a model against a reference transistor level design. However, for many applications a generic measurement to compare complex analog waveforms is useful. Over the past years, several algorithms have been discussed in various publications. This contribution will summarize some research results and shows the result of an assessment on the usability for typical waveform deviations.