Multi-layer TDS Approximation in Solving the Scattering from Dielectric or Metallic-Dielectric Structures

Konferenz: EuCAP 2009 - 3rd European Conference on Antennas and Propagation
23.03.2009 - 27.03.2009 in Berlin, Germany

Tagungsband: EuCAP 2009

Seiten: 5Sprache: EnglischTyp: PDF

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Nie, Zaiping; He, Shiquan (School of Electronic Engineering, University of Electronic Science and Technology of China (UESTC), Chengdu, 610054, P.R. China)

This paper is a summary of the method concerning the multi-layer TDS integral approximation in solving the scattering from dielectric or metallic-dielectric objects. The purpose is to highlight the advantages and limitations of this technique, and draw some useful conclusions.