Error-budget paradigms and laser mask pattern generator evolution

Konferenz: EMLC 2009 - 25th European Mask and Lithography Conference
12.01.2009 - 15.01.2009 in Dresden, Germany

Tagungsband: EMLC 2009

Seiten: 4Sprache: EnglischTyp: PDF

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Autoren:
Hamaker, H. Christopher; Jolley, Matthew J.; Berwick, Andrew D. (Applied Materials, Inc., 21515 NW Evergreen Pkwy., Hillsboro, OR, USA 97231)

Inhalt:
The evolution of the ALTA(R) series of laser mask pattern generators has increased the relative contribution of intensity errors on critical-dimension (CD) control to those from placement errors. This paradigm shift has driven a change in rasterization strategy wherein aerial image sharpness is improved at the cost of a slight decrease in the averaging of column-to-column placement errors. Print performance evaluation using small-area CD test patterns show improvements in stripe-axis local CD uniformity (CDU) 3sigma values of 15–25% using the new strategy, and systematic brush-error contributions were reduced by 50%. The increased importance of intensity errors, coupled with the improvement of ALTA system performance, has also made the mask-blank and process-induced errors a more significant part of the overall error budget. A simple model based on two components, a pattern-invariant footprint and one related to the exposure density ρ(x, y), is shown to describe adequately the errors induced by these sources. The first component is modeled by a fourth-order, two-dimensional polynomial, whereas the second is modeled as a convolution of ρ(x, y) with one or more Gaussian kernels. Implementation of this model on the ALTA 4700 system shows improvements in global CDU of 50%