Noise Analysis in RF CMOS active switching Mixers

Konferenz: ISTET 2009 - VXV International Symposium on Theoretical Engineering
22.06.2009 - 24.06.2009 in Lübeck, Germany

Tagungsband: ISTET 2009

Seiten: 5Sprache: EnglischTyp: PDF

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Autoren:
Darrat, Ahmed H.; Mathis, Wolfgang (Leibniz University of Hannover)

Inhalt:
This paper discusses the dependency of noise in switching mixers on the characteristics of the switching stage. Considering non-ideal switching, it is shown that the parameters of the switching stage affect the total noise produced at the mixer’s output. Including thermal and flicker noise, an analytical expression for noise in dependency on the technology and architecture parameters, as well as the local oscillator signal, is derived.