Circuit Fault Diagnosis Based on Wavelet Packet and Neural Network

Konferenz: ISTET 2009 - VXV International Symposium on Theoretical Engineering
22.06.2009 - 24.06.2009 in Lübeck, Germany

Tagungsband: ISTET 2009

Seiten: 4Sprache: EnglischTyp: PDF

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Autoren:
Kuczynski, Andrzej; Ossowski, Marek (Technical University of Lodz)

Inhalt:
In this paper, neural network algorithms of fault diagnosis for analog circuit containing MOS transistors are presented. Measurement of dynamic supply current is utilized for detecting the catastrophic faults. A discrete wavelet transform is used as preprocessor in order to reduce the nodes in input layer and hidden layer of BP neural network. The illustrative numerical examples are presented.