Current Status of Prognostics Techniques and Application to Power Electronics
Konferenz: CIPS 2010 - 6th International Conference on Integrated Power Electronics Systems
16.03.2010 - 18.03.2010 in Nuremberg, Germany
Tagungsband: CIPS 2010
Seiten: 6Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Bailey, Chris; Yin, Chunyan; Lu, Hua (School of Computing and Mathematical Sciences, The University of Greenwich, London SE10 9LS, UK)
Musallam, Mahera; Johnson, C. Mark (School of Electrical and Electronic Engineering, The University of Nottingham, Nottingham NG7 2RD, UK)
The existing prognostic techniques for electronics are reviewed and classified into three categories: data driven methods, model driven methods and fusion methods. It ranges from simple statistical methodologies (i.e. historical failure rates and time-series predictions) to high-fidelity models that consider failure mechanisms and their progression. Applications of these techniques, particularly the model driven techniques for power electronic modules are also reported.