Büschel, P.; Kanoun, O. (Technische Universität Chemnitz, Chemnitz, Germany)
The use of the Impedance Spectroscopy (IS) is well established in different fields of science. Beside the sometimes challenging task of the measurement process itself the interpretation of the gathered data is demanding and requires good modeling as well as adequate parameter extraction methods. In this paper the process of extracting impedance model parameters with a stochastic method called Particle Filter (PF) is described. Stochastic methods provide advantages over deterministic methods. The most salient one is their robustness against being trapped into local minima which is very important for complex nonlinear impedance models.