Validation of Pixel Location Accuracy of Orthorectified TerraSAR-X Products

Konferenz: EUSAR 2010 - 8th European Conference on Synthetic Aperture Radar
07.06.2010 - 10.06.2010 in Aachen, Germany

Tagungsband: EUSAR 2010

Seiten: 3Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Koppe, Wolfgang; Kiefl, Nadine; Hennig, Simon D.; Janoth, Jürgen (Infoterra GmbH, Germany)

For the pixel location accuracy of orthorectified TerraSAR-X Products, the orbit measurement accuracy, incidence angle and the Digital Elevation Model (DEM) used for orthorectification were identified as the main influencing factors. In order to quantify the influence of orbit accuracy and DEM quality, several representative test sites and scenarios were set up. Investigations on geolocation accuracy were performed using different orbit precision (predicted, rapid and science orbit) as well as different DEMs for orthorectification. Results of the study showed a strong varying pixel location accuracy of orthorectified TerraSAR-X products in dependence of orbit precision and DEM quality.