Metallic Line Testing Solution for Next Generation Networks
Konferenz: WTC - World Telecommunications Congress 2010 - Telecommunications: The Infrastructure for the 21st Century
13.09.2010 - 14.09.2010 in Vienna, Austria
Tagungsband: WTC - World Telecommunications Congress 2010
Seiten: 5Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Noessing, Gerhard; Canella, Alberto; Trautmann, Steffen (Lantiq A GmbH, Villach, Austria)
In this paper an integrated DSL-friendly hardware solution is proposed for Metallic Line Testing (MELT) and wetting current functionality in an All Digital Loop (ADL) environment, where metallic access to the line in terms of POTS hardware or dedicated test heads for line testing is no longer available. Starting with state-of-the-art line testing for access networks, the importance of MELT as an indispensible part of a complete, reliable line testing solution is emphasized. The underlying network model required to determine the MELT parameters is introduced and typical error cases explained in detail. The network maintenance requirements for useful MELT integration are discussed and an overview of the current state of MELT standardization given. Finally, a MELT solution, which is G.lt (G.992.2) standard-compliant, is introduced briefly.