Time Resolved Measurement of Interface and Bulk Recombination of Solar Cell Materials
Konferenz: IPRM 2011 - 23th International Conference on Indium Phosphide and Related Materials
22.05.2011 - 26.05.2011 in Berlin, Germany
Tagungsband: IPRM 2011
Seiten: 4Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Szabó, Nadine (NaMLab, Dresden, Germany)
Schwarzburg, Klaus; Dobrich, Anja; Hannappel, Thomas (Helmholtz-Centre Berlin, Berlin, Germany)
We have investigated the effect of different metal organic vapor phase epitaxy (MOVPE) preparation routes for the In0.53Ga0.47As/InP interface on the interface recombination velocity and its lateral interface homogeneity. The preparation routines in a MOVPE reactor were varied in order to initiate a lateral homogenous layer growth and to form the In-GaAs/InP interface as sharp as possible, which is of major importance for the performance of thin device structures such as tunnel junctions in multi junction solar cells. For the growth characterization, we employed in situ reflectance difference/anisotropy spectroscopy and low energy electron diffraction to depict the favorable interface formation routes. Minority carrier lifetime dependence in a corresponding InP/InGaAs/InP double hetero structure was measured with spatially resolved and time-resolved photoluminescence using a confocal single photon counting setup. It was found that a specific, III-rich termination of the underlying InGaAs layer was most favorable for optimum results.