EMI Susceptibility Analysis of Contactless Smart Cards

Konferenz: Smart SysTech 2012 - European Conference on Smart Objects, Systems and Technologies
12.06.2012 - 13.06.2012 in Osnabrück, Deutschland

Tagungsband: Smart SysTech 2012

Seiten: 5Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Prestros, Ralph (NXP Semiconductors Austria GmbH, Gratkorn, Austria)
Heuvelman, Wilmar; Janssen, Rick (NXP Semiconductors B. V., Eindhoven, the Netherlands)

This paper describes a novel methodology to verify, through simulation, whether contactless smart cards have the capability to reject RF interference from mobile phone transmissions. In this test bench the immunity test signals are injected indirectly into the contactless chip card under design by using a model of a well known EMC test device, the GTEM cell. A GTEM cell is used for this purpose because it is the only real-life test environment that allows exposing the DUT with a localized plane wave from 13.56 MHz up to multi-GHz frequencies. A comparison of the simulations with measurements, using the proposed methodology, shows excellent agreement.