Logic Self Repair Architecture with Self Test Capabilities

Konferenz: Zuverlässigkeit und Entwurf - 6. GMM/GI/ITG-Fachtagung
25.09,2012 - 27.09.2012 in Bremen, Deutschland

Tagungsband: Zuverlässigkeit und Entwurf

Seiten: 7Sprache: EnglischTyp: PDF

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Koal, Tobias; Ulbricht, Markus; Vierhaus, Heinrich T. (Computer Engineering Group, Brandenburg University of Technology Cottbus, Germany)
Engelke, Piet (Infineon Technologies AG, Neubiberg, Germany)

Large-scale integrated systems fabricated in nano-technologies are harmed by specific fault effects, which may limit system reliability on one hand and system lifetime on the other side. Repair technologies may serve to compensate wear-out induced flaws by the introduction of spare resources. Repair technologies, however, must be effective in terms of redundancy allocation on one side and additional administrative overhead on the other hand. Furthermore, self repairing systems must perform test and fault diagnosis in an effective way. An advanced architecture is introduced, which may even serve to use redundant resources selectively for fault detection and fast compensation.