Error Correction of Automatic Testing Systems for Hall Effect Current Sensors

Konferenz: Sensoren und Messsysteme 2014 - Beiträge der 17. ITG/GMA-Fachtagung
03.06.2014 - 04.06.2014 in Nürnberg, Deutschland

Tagungsband: ITG-Fb. 250: Sensoren und Messsysteme 2014

Seiten: 5Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Autoren:
Liu, Cheng; Liu, Ji-Gou (ChenYang Technologies GmbH & Co. KG., Markt Schwabener Str. 8, 85464 Finsing, Germany)

Inhalt:
In this paper an error correction method is proposed for improving the measuring accuracy of automatic testing systems for Hall Effect current sensors. The errors of the original testing system are determined by a reference sensor or a reference resistor. These error values are saved as corrections into a data matrix in the testing system. The systematic errors of the testing system are corrected by using the correction data matrix. In this way a conventional measuring system can be enhanced into a precise measuring system. The proposed method can be used in all automatic testing systems.