Update of the Interferometric Processing Algorithms for the Tan-DEM-X High Resolution DEMs
Konferenz: EUSAR 2016 - 11th European Conference on Synthetic Aperture Radar
06.06.2016 - 09.06.2016 in Hamburg, Germany
Tagungsband: EUSAR 2016
Seiten: 4Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Lachaise, Marie; Fritz, Thomas (German Aerospace Center (DLR), Germany)
The final TanDEM-X Digital Elevation Model (DEM) will be completely available by the end of 2016. It provides an up-to-date measurement of the terrain height of the whole Earth’s landmass with an unprecedented high accuracy. The next milestone of the TanDEM-X Mission is to supply high-resolution DEMs with even better height accuracy and resolution for dedicated areas. For this purpose, new bistatic data sets are being acquired with very low heights of ambiguity. This paper proposes an adaption of the Integrated TanDEM-X Processor, which is operationally used for the generation of the building blocks (Raw DEMs) of the global DEM data, so that it can process Raw DEMs of higher resolution by making good use of the finalized global DEM.