Improving TamDEM-X DEMs accuracy using large-baseline data from the science phase
Konferenz: EUSAR 2016 - 11th European Conference on Synthetic Aperture Radar
06.06.2016 - 09.06.2016 in Hamburg, Germany
Tagungsband: EUSAR 2016
Seiten: 6Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Pinheiro, Muriel; Reigber, Andreas (DLR, Germany)
SAR interferometry has been extensively used for the generation of Digital Elevation Models (DEMs). In particular, the TanDEM-X stands out as a dedicated mission designed to provide very accurate elevation information in a global scale. From October 2014 to December 2015 the mission endured its science phase during which interferometric data with increased baseline were acquired, thus allowing for the retrieval of local DEMs with even higher vertical accuracy than the standard TanDEM-X products. This paper present first results regarding the generation of DEMs using the large baseline experimental TanDEM data, including a preliminary evaluation of the obtained accuracy.