Relative Height Accuracy Analysis of TanDEM-X DEM Products
Konferenz: EUSAR 2016 - 11th European Conference on Synthetic Aperture Radar
06.06.2016 - 09.06.2016 in Hamburg, Germany
Tagungsband: EUSAR 2016
Seiten: 5Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Gonzalez, Carolina; Bräutigam, Benjamin; Rizzoli, Paola (Microwaves and Radar Institute, German Aerospace Center, Germany)
Digital Elevation Models (DEMs) are of fundamental importance for a broad range of commercial and scientific applications. The relative height accuracy of a DEM is one of the most important quality parameters as it refers to the local differences among adjacent elevation values. The German high-resolution radar satellites TerraSAR-X and TanDEM-X have been acquiring interferometric SAR data over the last 4 years for the TanDEM-X mission. From the acquired data a homogeneous and highly accurate global DEM is being generated. This global DEM is specified with 2 m relative height accuracy at a 12 m posting. Results of the actual relative height accuracy for TanDEM-X data are presented as well as a detailed evaluation of the accuracy for specific land classes showing the high quality of these products.