Relative Height Accuracy Analysis of TanDEM-X DEM Products

Inhalt:
Digital Elevation Models (DEMs) are of fundamental importance for a broad range of commercial and scientific applications. The relative height accuracy of a DEM is one of the most important quality parameters as it refers to the local differences among adjacent elevation values. The German high-resolution radar satellites TerraSAR-X and TanDEM-X have been acquiring interferometric SAR data over the last 4 years for the TanDEM-X mission. From the acquired data a homogeneous and highly accurate global DEM is being generated. This global DEM is specified with 2 m relative height accuracy at a 12 m posting. Results of the actual relative height accuracy for TanDEM-X data are presented as well as a detailed evaluation of the accuracy for specific land classes showing the high quality of these products.