autoSWIFT: Validation of new automotive requirements via systematic rating of semiconductor technologies

Konferenz: AmE 2017 – Automotive meets Electronics - 8. GMM-Fachtagung
07.03.2017 - 08.03.2017 in Dortmund, Deutschland

Tagungsband: GMM-Fb. 87: AmE 2017

Seiten: 6Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Lehndorff, Thomas; Alsioufy, Adnan; Hirler, Alexander; Sulima, Torsten; Hansch, Walter (Universität der Bundeswehr, München, Germany)
Lochner, Helmut (Audi AG, Ingolstadt, Germany)

Due to e-mobility and autonomous driving the requirements for vehicles, subcomponents and semiconductor technologies are changing. This investigation illustrates these changes and shows how those can be recorded more detailed with the use of mission profiles. A Technology-BlackBox (TBB) is presented. The TBB compares stated requirements with semiconductor technology data and determine if the requirements are fulfilled. It is shown how this tool helps to identify development risks early in the development, and therefore can be used to secure simultaneous engineering along the supply chain.