Investigation of Mass Transfer Speed Theory on chemical mechanical polishing

Konferenz: ICPT 2017 - International Conference on Planarization/CMP Technology
11.10.2017 - 13.10.2017 in Leuven, Belgium

Tagungsband: ICPT 2017

Seiten: 8Sprache: EnglischTyp: PDF

Persönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt

Autoren:
Liu, Yuling; Li, Yanlei; Wang, Chenwei; Yang, Liu; Wang, Jianchao (Institue of Microelectronics, Hebei University of Technology, Tianjin, 300130)

Inhalt:
Abstract: A more complete theoretical system about chemical mechanical planarization (CMP) of the single material or various materials in the same plane was proposed, which studied from the mechanics, tribology, physics, physical chemistry, materials engineering, microelectronics engineering, chemistry, computer and other disciplines, comprehensively. And with the theoretical direction, the adjustable engineering technology and materials can apply different products was researched, which achieved higher cost performance and multiplier effect. Keywords: Mass transfer speed, theory, chemical mechanical polishing