Condition and Health Monitoring in Power Electronics

Konferenz: CIPS 2018 - 10th International Conference on Integrated Power Electronics Systems
20.03.2018 - 22.03.2018 in Stuttgart, Deutschland

Tagungsband: ETG-Fb. 156: CIPS 2018

Seiten: 8Sprache: EnglischTyp: PDF

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Autoren:
Mollov, Stefan (Mitsubishi Electric R&D Centre Europe, France)
Blaabjerg, Frede (Department of Energy Technology, Aalborg University, Denmark)

Inhalt:
Condition and health monitoring (C&HM) is an effective means of improving the availability and controlling the life-time cost of power electronic components, converters and systems. Many solutions have been developed, but their adoption in industrial applications is still scarce. This paper intends to the reasons for this by favouring Industrially-motivated research. Advanced C&HM techniques that open new possibilities for industrialisation are reviewed. Their potential, limitations and implementation are outlined and critically assessed with the goal of benefiting both industry applications and research. A significant part of the paper is dedicated to C&HM for power devices and modules, responding to the general perception that they are the least reliable with topics such as prognostics-based qualification for power electronics to predict the future reliability of the products and remaining useful lifetime methods. In-situ methods for estimation of junction temperature and use of temperature sensitive electrical parameters are summarised within the framework of C&HM. The C&HM of other notoriously unreliable components, such as capacitors and batteries are also addressed.