Lifetime Testing Method for Ceramic Capacitors for Power Electronics Applications

Konferenz: CIPS 2018 - 10th International Conference on Integrated Power Electronics Systems
20.03.2018 - 22.03.2018 in Stuttgart, Deutschland

Tagungsband: ETG-Fb. 156: CIPS 2018

Seiten: 6Sprache: EnglischTyp: PDF

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Autoren:
Dresel, Fabian; Tham, Nils; Erlbacher, Tobias; Schletz, Andreas (Fraunhofer IISB, Erlangen, Germany)

Inhalt:
As large ceramic capacitors are entering the field of power electronics the question of the reliability of these components under operating conditions arises. In this work a Cuk converter is proposed for stressing and lifetime testing of ceramic capacitors. A method for online measurement of capacitances in the converter is proposed. Possible applications for testing ceramic capacitors are described. The converter can be used for characterization tests. Furthermore HALT testing under increased voltage and temperature is described. Finally, a power cycling test method for ceramic capacitors is proposed.