Design of an EMC-improved Regulated Charge Pump in 180-nm CMOS technology
Konferenz: ANALOG 2018 - 16. GMM/ITG-Fachtagung
13.09.2018 - 14.09.2018 in München/Neubiberg, Deutschland
Tagungsband: GMM-Fb. 91: ANALOG 2018
Seiten: 4Sprache: EnglischTyp: PDFPersönliche VDE-Mitglieder erhalten auf diesen Artikel 10% Rabatt
Nuernbergk, Dirk M.; Lang, Christian; Petri, Viktor; Frey, Micheal (Melexis GmbH, Erfurt, Konrad-Zuse-Str. 15, 99099 Erfurt, Germany)
The charge pump is a critical block for the electromagnetic compatibility of an IC in motor driver applications. We present a new and simple regulation concept of a charge pump, which can work in continuous and discontinuous mode of operation. It will be shown in this paper that the continous and discontinuous mode have different EMC performance. The charge pump has a chaotic switching behavior in this case and this effect spreads the emitted power across a wider range of frequencies. The concept of the charge pump is presented and is discussed in detail. Measurement results are shown for a charge pump realized in a 180 nm CMOS technology in the continous mode.