Digitalization in high-power test laboratories

Konferenz: VDE-Hochspannungstechnik 2018 - ETG-Fachtagung
12.11.2018 - 14.11.2018 in Berlin, Deutschland

Tagungsband: ETG-Fb. 157: VDE-Hochspannungstechnik

Seiten: 4Sprache: EnglischTyp: PDF

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Autoren:
Baum, Benjamin; Smeets, Rene; Achterkamp, Marc (KEMA Laboratories DNV GL, Arnhem, The Netherlands)

Inhalt:
The electrical power system is undergoing a fundamental change. Like with all technical components, a gradual digital transformation into an Internet of Things is happening. In addition, advances in the fields of (power) electronics and measurement techniques expand the range of transmission and distribution (T&D) equipment. This does not only lead to new products but also more and more former stand-alone components are integrated into primary components. Micro-electronics are transferred from station level to bay level, exposing these to higher EM fields. Consequently, this changes the way to test ‘digitally integrated’ T&D equipment as well as how to operate test facilities. This contribution focuses on four challenges involved in this transition with respect to the world largest power laboratory. The first part deals with the integration of the communication standard (IEC 61850) into the laboratory. Here, experiences of sampled measured values (SMV) and generic object oriented substation events (GOOSE) are presented. The second part is focused on low-power instrument transformers (LPIT), also known as non-conventional instrument transformers (NCIT). Here, test experiences are shared and discussed. In addition, pros and cons of LPITs in highpower laboratories are given. The third part deals with testing of digitally communicating and controlled T&D equipment. Here, challenges encountered during a ring main unit (RMU) test are discussed. The last parts deals with the challenges of testing miniaturized T&D equipment.