A Novel Automated NFC Interoperability Test and Debug System
Konferenz: Smart SysTech 2019 - European Conference on Smart Objects, Systems and Technologies
04.06.2019 - 05.06.2019 in Munich, Germany
Tagungsband: ITG-Fb. 289: Smart SysTech 2019
Seiten: 8Sprache: EnglischTyp: PDF
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Autoren:
Erb, Martin; Steger, Christian; Troyer, Martin (Institute of Technical Informatics, Graz University of Technology, Austria)
Preishuber-Pfluegl, Josef (CISC Semiconductor GmbH, Klagenfurt, Austria)
Inhalt:
In this paper, we present a new system architecture for an automated Near Field Communication (NFC) interoperability test and debug system. The increasing availability of NFC-enabled devices and the resulting amount of NFC applications require new methods for interoperability testing and debugging in order to reduce costs. We combine already existing state-of- the-art interoperability test systems and the know-how of manual debugging methods to develop a new automated NFC interoperability test and debug system architecture. We analyze the main components of state-of-the-art test systems, define new requirements for the new system architecture and evaluated the feasibility. Our new architecture significantly reduces the time and cost of developing and certifying new NFC-enabled devices.