Implementation and validation of a dynamic calorimetric method to evaluate the losses in switching discrete power MOSFETs
Konferenz: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
24.03.2020 - 26.03.2020 in Berlin, Deutschland
Tagungsband: ETG-Fb. 161: CIPS 2020
Seiten: 6Sprache: EnglischTyp: PDF
Tran, Do Phuong Uyen; Avenas, Yvan (Universite Grenoble Alpes, CNRS, Grenoble INP, G2Elab, 38000 Grenoble, France)
Lefebvre, Stephane (SATIE, ENS Paris Saclay, Cnam, CNRS, 94230 Cachan, France)
The design of static converters is based on various factors, including the losses in power semiconductor components and the working temperature of these components. This paper presents a dynamic calorimetric method whose objective is to estimate losses in semiconductor components with consideration of their evolution as a function of junction temperature. In order to evaluate the accuracy of this method, experimental tests are carried out with power MOSFET components used in a switching cell. A method for separating conduction and switching losses is also proposed.