A Review on the Application of On-line Von (On-State Voltage) Sens-ing for Junction Temperature Estimation of Power Semiconductor Modules
Konferenz: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
24.03.2020 - 26.03.2020 in Berlin, Deutschland
Tagungsband: ETG-Fb. 161: CIPS 2020
Seiten: 8Sprache: EnglischTyp: PDF
Degrenne, Nicolas; Brandelero, Julio; Kawahara, Chihiro; Mollov, Stefan (Mitsubishi Electric R&D Centre Europe, Rennes, France)
The on-state voltage Von of a semi-conductor power transistor is an electrical parameter sensitive to the temperature, current, degradation and gate voltage. Junction temperature is recognized as an enabler to condition and health monitoring. In the last five years, a numerous number of papers proposed on-line Von sensor circuits and methods for junction temperature (Tj) estimation. This paper classifies, presents and analyses in a didactic way the state-of-the-art on this topic. It presents the different on-line monitoring methods, sensors, and calibration requirements for an accurate and robust estimation. It lists other challenges limiting the applicability of Von methods, and it finally discusses future opportunities.