Power cycling close to 50- Hz load, low temperature swings combined with an adjustable part of switching losses

Konferenz: CIPS 2020 - 11th International Conference on Integrated Power Electronics Systems
24.03.2020 - 26.03.2020 in Berlin, Deutschland

Tagungsband: ETG-Fb. 161: CIPS 2020

Seiten: 6Sprache: EnglischTyp: PDF

Autoren:
Seidel, Peter; Schwabe, Christian; Lutz, Josef (Department of Power Electronics and EMC, University of Technology, Chemnitz, Germany)

Inhalt:
Power cycling tests with low temperature swings are interesting for a lot of users, because often many of them occur in the application. However, most manufacturers and lifetime models cannot make a statement about the range in which a temperature swing leads to permanent damage (plastic strain) or only to reversible deformation (elastic strain). In this work, a power cycling test with superimposed switching losses is intended to investigate the area where both mechanisms have an impact on the lifetime and which dependencies can be detected. Furthermore, a simulation will be performed to detect the influence of plastic and elastic strain in the bond interconnection regarding lifetime.