Comparison of Optical Polarization-Dependent Loss Measurement Methods

Konferenz: Photonische Netze - 21. ITG-Fachtagung
24.11.2020 - 25.11.2020 in online

Tagungsband: ITG-Fb. 294: Photonische Netze

Seiten: 4Sprache: EnglischTyp: PDF

Autoren:
Noe, Reinhold; Koch, Benjamin (Paderborn University, EIM-E, Paderborn, Germany & Novoptel GmbH, Paderborn, Germany)

Inhalt:
A number of polarization-dependent loss (PDL) measurement methods has been proposed for the characterization of optical devices. These use all polarization states or only 0deg, 45deg, 90deg and circular or tetrahedron vertices or equivalent configurations on the Poincaré sphere. They determine PDL alone or the complete Mueller matrix and potentially polarization mode dispersion. They need no calibration or need polarimeter(s). Speed is also an issue. We compare performance and features of these 5 PDL measurement methods. A fast polarization scrambler with LiNbO3 device generates the test polarizations.