Wheat Planting Area Extraction and Yield Evaluation Based on Polarization Scattering Characteristics

Konferenz: EUSAR 2021 - 13th European Conference on Synthetic Aperture Radar
29.03.2021 - 01.04.2021 in online

Tagungsband: EUSAR 2021

Seiten: 4Sprache: EnglischTyp: PDF

Cai, Aimin; Sun, Long (38th Research Institute, China Electronic Technology Group Corporation, Hefei, China)

Based on the analysis of scattering statistical feature and polarization decomposition theory, the scattering features of different growth stages of wheat were analyzed. On the basis of conventional classification, the planting area of wheat is extracted based on the difference of scattering features, which can improve the classification accuracy. Further, Based on the scattering mechanism, a new growth parameters was reconstructed, which can inverse the wheat growth well and improve the yield estimate more accuracy.