How data-driven approaches can increase the accuracy of LED reliability predictions

Konferenz: MikroSystemTechnik Kongress 2021 - Kongress
08.11.2021 - 10.11.2021 in Stuttgart-Ludwigsburg, Deutschland

Tagungsband: MikroSystemTechnik Kongress 2021

Seiten: 4Sprache: EnglischTyp: PDF

Benkner, Simon; Klir, Stefan; Herzog, Alexander; Khanh, Tran Quoc (University of Darmstadt, Darmstadt, Germany)

This paper proposes a methodology on the classification of LED degradation time-series to a suitable fitting model based on standard LED aging test data. Therefor a data set of about 2000 LED degradation curves was analyzed regarding their projected lifetime of various extrapolation models. The outcomes were compared to the standard exponential projection model. Results indicate a deviation of the projected