Closed-Loop Approach on Formal Specification for Semiconductor Test

Konferenz: MikroSystemTechnik Kongress 2021 - Kongress
08.11.2021 - 10.11.2021 in Stuttgart-Ludwigsburg, Deutschland

Tagungsband: MikroSystemTechnik Kongress 2021

Seiten: 4Sprache: EnglischTyp: PDF

Schott, Christian; Mayer, Franziska; Billich, Enrico; Yazdani, Saeid; Sauppe, Matthias; Wolz, Werner; Heinkel, Ulrich (Chemnitz University of Technology, Faculty Electrical Engineering and Information Technology, Professorship of Circuit and System Design, Chemnitz, Germany)

Test specifications are commonly written in an informal format, thus leading to ambiguities and misconceptions during their manual transformation to executable test programs. Increasing complexity of semiconductors and the need for reduced test time require novel methodologies in design, verification and test. In this paper, we propose a workflow tool called SpecScribe that targets a semi-automated approach for formal test specification, interfacing of Automatic Test Equipment (ATE) and handling of test results. Our tool provides models covering information about the Device Under Test (DUT), the test setup as well as the tests and the according test flow. Links and references between the specification items and different steps during the test workflow enable validation and verification of the specification on multiple abstraction levels. With the ability to directly target ATE for test setup and a result back-annotation to the specification, a closed loop approach for test development can be achieved. The proposal was evaluated using an inhouse developed ASIC and showed the potential of our solution. However, enhancements by incorporating test program generation capabilities are parts of future research.