Oversampling Σ-Δ Data Converters for Automated ADC-Test

Konferenz: ANALOG '05 - 8. GMM/ITG-Diskussionssitzung: Entwicklung von Analogschaltungen mit CAE-Methoden
16.03.2005 - 18.03.2005 in Hannover, Deutschland

Tagungsband: ANALOG '05

Seiten: 5Sprache: EnglischTyp: PDF

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Kolberg, S.; Zehner, B. (Fachhochschule Stralsund, Germany)
Mattes, H.; Sattler, S. (Infineon Technologies, Munich, Germany)

Nowadays goal in ADC test concepts is to maintain the high quality of the Device Under Test (DUT) at lowest costs of the test as well as most increased throughput. The paper covers the generation of high qualified and reliable analog test-signals out of pure digital signals using Σ Δ-modulation techniques. We report on the assets and drawbacks of this approach and prove by simulations and measurements that the concept can be easily and straight forward implemented for mid precision ADC testing on a Teradyne J750 digital tester. Furthermore we identify potential hazards and show their impact on the test signal quality.