Investigation of Waveguide Mode Profile Using Low Coherent Interferometric Method

Konferenz: ECOC 2007 - 33rd European Conference and Exhibition of Optical Communication
16.09.2007- 20.09.2007 in Berlin, Germany

Tagungsband: ECOC 2007

Seiten: 2Sprache: EnglischTyp: PDF

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Wang, Zhipeng; Chen, Yung Jui (Ray) (CSEE Department, University of Maryland Baltimore County, USA)

We demonstrate for the first time a waveguide mode profile characterization scheme in an AWG, utilizing low coherent interferometric measurement. The technique is very effective in characterizing input waveguide design in advanced AWG devices.